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Manufacturing Testing and Security Countermeasures
Chapitre d'ouvrage

Manufacturing Testing and Security Countermeasures

Giorgio Di Natale, Marie-Lise Flottes, Bruno Rouzeyre et Paul-Henri Pugliesi-Conti
Hardware Security and Trust, pp.127-148
Springer International Publishing
14/01/2017

Résumé

Automatic Test Pattern Generation (ATPG) Built-in Self-test (BIST) Scan Chain Scan Shift Scan-enable Signal

Indicateurs

1 Consultations de la notice

Détails

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