- Title
- Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique
- Creators - without role
- Simon Martin - Institut des Nanotechnologies de LyonBrice Gautier - Institut des Nanotechnologies de LyonNicolas Baboux - Institut des Nanotechnologies de LyonAlexei Gruverman - University of Nebraska–LincolnAdrian Carretero-Genevrier - Université de Montpellier, Institut d'Electronique et des Systèmes - IESMarti Gich - Institut de Ciència de Materials de BarcelonaAndrés Gómez - Institut de Ciència de Materials de Barcelona
- Publication Details
- Electrical Atomic Force Microscopy for Nanoelectronics, pp.173-203
- Identifiers
- 9947379709311
- Academic Unit
- Institut d'Electronique et des Systèmes - IES
- Language
- English
- Resource Type
- Book chapter
- Local Fields
- hal-02290033
Book chapter
Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique
Electrical Atomic Force Microscopy for Nanoelectronics, pp.173-203
01/08/2019
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